Analog Optical Signal Transmission
Langer EMV-Technik GmbH`s optical signal transmission systems are used for the floating transmission of signals from the device under test up to a distance of 20 m.
Measurement Technology for the Development Stage
The measurement technology for the development stage enables the detection of magnetic and electric field sources at your PCB directly at the workplace.
ICR E150 set
Near-Field Microprobe E-field 7 MHz up to 3 GHz
The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
ICR 03 set
Near-Field Microprobes Set
The ICR 03 set contains three of our ICR near-field microprobes (magnetic or E field) of your choice.
The probes are used to measure magnetic or electric near fields with extremely high resolution and sensitivity. Optimal is a distance of < 1 mm to the measuring object. The probe head is equipped with either a vertical (HV) or horizontal (HH) measuring coil.
A preamplifier is integrated in every probe, which is powered by the BT 706 bias tee.
Near-Field Microprobe Sets ICR HV H Field
The ICR HV set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is vertical in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
Near-Field Microprobe Sets ICR HH H Field
The ICR HH set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is horizontal in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
Langer MFA, Active, Near Field Probes (1MHz up to 6 GHz)
The MFA family consists of four active magnetic field probes. The MFA 01 includes three magnetic field probes. The MFA 02 set consists of two magnetic field probes for low frequency measurements.
Langer HR, Passive, Near Field Probes (up to 40 GHz)
The HR family consists of an H-field probe and an E-field probe for the measurement of high-frequency RF fields up to 40 GHz during development.
Langer SX, Passive, Near Field Probes (1GHz up to 20 GHz)
The SX family consists of three H-field probes and one E-field probe.
The SX1 set (two H-field probes and one E-field probe) and the SX-R 20-1 set are available.
Langer XF, Passive Near Field Probes (30 MHz up to 6 GHz)
The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.