These probes have
high-resistance inputs with
capacitive coupling and a low
input capacitance so that the RF
voltages can be measured on
output and input pins of the EUT
without a noticeable current
stressing the pins.
Probes
for pulse generation
The probes from the 200 and 300 series are
available for burst pulse injection. Their
dimensions depend on the burst injection
mechanisms in electronic modules. The probes
from the 200 series are designed for
measurements on supply and GND pins. They
have a much higher coupling capacitance and
an extremely low resistance. They are
supplied and controlled by the Langer Burst
Generator. The BPS 201 burst power station
supplies and controls the probes. The burst
parameters are set from a PC via a serial
interface. The burst power station is
supplied by a plug-in power supply unit (12V
DC).
IC EMI
Test Board The
IC test board has been designed for
developers and manufacturers of digital IC's
such as processors or ASIC‘s. The design
phase is the best time to determine IC
characteristics to identify coupling
mechanisms within the IC and to specifically
influence them during redesign. The IC user
is able to compare various IC's with each
other independent of his current module and
thus assess and choose manufacturers as well
as technologies. The confined structure and
the continuous GND plane ensure correct
measurements up to and within the GHz range.
The designer can use the Test Board to:
- couple burst pulses (high and low
resistance) into pins.
- carry out RF (current and voltage)
measurements on pins without any
interaction.
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